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Title: Interface recombination and carrier confinement at a GaAs/Ga/sub x/In/sub 1-x/P double heterojunction studied by picosecond population modulation spectroscopy

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.92935· OSTI ID:5610435

Sensitive picosecond excite-probe modulation methods have been applied to study electron-hole confinement and interface lifetime in a molecular beam epitaxy (MBE) grown n-type Ga/sub x/In/sub 1-x/P/ GaAs/Ga/sub x/In/sub 1-x/P double heterojunction. Time-varying transmission spectra at 77 K have been examined near the E/sub 0/+..delta../sub 0/ transition in GaAs and near the fundamental edge in Ga/sub x/In/sub 1-x/P (x = 0.47), following the injection of a small electron-hole population. We demonstrate directly the confining efficiency of the structure for electrons and, consistent with other recent evidence, find that the interface recombination velocity in the relatively strain-free heterostructure is reduced to less than 1 x 10/sup 4/ cm/s from the value of 5 x 10/sup 5/ cm/s for a free GaAs surface. The latter has been determined by us directly from time-resolved reflection spectra which suggest further applications of these methods to surface spectroscopy of semiconductors.

Research Organization:
Division of Engineering, Brown University, Providence, Rhode Island 02912
OSTI ID:
5610435
Journal Information:
Appl. Phys. Lett.; (United States), Vol. 40:10
Country of Publication:
United States
Language:
English