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Two different species of deuterium implanted into a pyrolytic graphite observed by XPS--SIMS

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.572169· OSTI ID:5609254

Trapped states of deuterium implanted into a pyrolytic graphite with 5 keV were investigated by means of the x-ray photoelectron spectroscopy and the secondary ion mass spectrometry. Chemical shift and broadening of C 1s peak were observed in the XPS spectra due to deuterium-ion implantation at room temperature. The shift and the broadening increased with the deuterium fluence to reach constant values. In the SIMS spectra, CD/sup -/ and C/sub 2/D/sup -/ peaks appeared due to the deuterium implantation. The intensity of the CD/sup -/ peak increased with the fluence to reach a constant value, whereas that of the C/sub 2/D/sup -/ peak passed through a maximum to decrease to a constant value. A linear relation was observed between the chemical shift and the CD/sup -/ peak. The chemical shift and the CD/sup -/ peak disappeared after annealing the sample at 600 /sup 0/C for 5 min, whereas the broadening of the C 1s peak and the C/sub 2/D/sup -/ peak disappeared after annealing the sample at 900 /sup 0/C for 5 min. On the basis of these observations, it is concluded that at least two different species of the deuterium are formed in the graphite due to the deuterium implantation.

Research Organization:
Radio-isotope Laboratory, Toyama University, Gofuku 3190, Toyama 930, Japan
OSTI ID:
5609254
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 1:3; ISSN JVTAD
Country of Publication:
United States
Language:
English