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Behavior of implanted D and He in pyrolytic graphite

Conference ·
OSTI ID:7058891
The behavior of deuterium and helium implanted near room temperature at 8 keV into prism plane oriented graphite was studied as a function of implantation fluence and post-anneal temperature. Depth profiles of the implanted species were measured by proton backscattering. Quantitative thermal desorption measurements were performed to study the species emitted from the sample during ramp heating to 950/sup 0/C.
Research Organization:
Sandia Labs., Albuquerque, NM (USA); Max-Planck-Institut fuer Plasmaphysik, Garching/Muenchen (Germany, F.R.)
DOE Contract Number:
W-7405-ENG-26
OSTI ID:
7058891
Report Number(s):
SAND-78-0754C; CONF-780467-5
Country of Publication:
United States
Language:
English