Behavior of implanted D and He in pyrolytic graphite
The behavior of deuterium and helium implanted near room temperature at 8 keV into prism plane oriented graphite was studied as a function of implantation fluence and post-anneal temperature. Depth profiles of the implanted species were measured by proton backscattering. Quantitative thermal desorption measurements were performed to study the species emitted from the sample during ramp heating to 950/sup 0/C. A summary of the results follows: (1) 100% trapping was observed for D implants up to fluence of 10/sup 18/ D/cm/sup 2/. (2) The measured mean ranges and full widths for D implants agreed with previous measurements but exceed the calculated ..delta..Rp for fluences up to 10/sup 18/ D/cm/sup 2/; above this fluence the profiles broaden toward the surface with the rear edge remaining at a constant depth.
- Research Organization:
- Sandia Labs., Albuquerque, N.Mex. (USA); Max-Planck-Institut fuer Plasmaphysik, Garching/Muenchen (Germany, F.R.)
- Sponsoring Organization:
- USDOE
- DOE Contract Number:
- W-7405-ENG-26; EY-76-C-04-0789
- OSTI ID:
- 6857333
- Report Number(s):
- CONF-780431-12
- Country of Publication:
- United States
- Language:
- English
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