Structure determination of the Si(111):B( radical 3 times radical 3) R 30 degree surface: Subsurface substitutional doping
Journal Article
·
· Physical Review Letters; (USA)
- AT T Bell Laboratories, Murray Hill, New Jersey 07974 (US)
Synchrotron x-ray diffraction has been used to analyze the ({radical}3{times}{radical}3){ital R}30{degree} reconstruction of B/Si(111). Excellent agreement is obtained with in-plane data for a model in which boron sits in every third site of threefold symmetry. Out-of-plane diffraction, however, is only consistent with boron {ital below} the surface in the fivefold-coordinated substitutional site under a silicon {ital T}{sub 4} adatom. The structure is confirmed by the growth behavior under room-temperature Si deposition in which the silicon adatom is displaced from its ordered site leaving boron in a two-dimensional ordered substitutional array.
- OSTI ID:
- 5574353
- Journal Information:
- Physical Review Letters; (USA), Journal Name: Physical Review Letters; (USA) Vol. 63:12; ISSN PRLTA; ISSN 0031-9007
- Country of Publication:
- United States
- Language:
- English
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Thu Jul 01 00:00:00 EDT 1993
· Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (United States)
·
OSTI ID:6300641
LEED studies of atomic structures of Si[l brace]111[r brace] [radical]3 [times] [radical]3-30[degrees]-metal surface phases. [LEED (low-energy electron diffraction)]
Thesis/Dissertation
·
Tue Dec 31 23:00:00 EST 1991
·
OSTI ID:7236259
Related Subjects
36 MATERIALS SCIENCE
360602* -- Other Materials-- Structure & Phase Studies
ADSORPTION
AMORPHOUS STATE
ANNEALING
BORON
BORON IONS
BREMSSTRAHLUNG
CHARGED PARTICLES
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTS
ENERGY RANGE
HEAT TREATMENTS
INTERFACES
ION IMPLANTATION
IONS
KEV RANGE
KEV RANGE 10-100
MEDIUM TEMPERATURE
RADIATIONS
SCATTERING
SEMIMETALS
SILICON
SORPTION
STRUCTURE FACTORS
SYNCHROTRON RADIATION
X-RAY DIFFRACTION
360602* -- Other Materials-- Structure & Phase Studies
ADSORPTION
AMORPHOUS STATE
ANNEALING
BORON
BORON IONS
BREMSSTRAHLUNG
CHARGED PARTICLES
COHERENT SCATTERING
CRYSTAL STRUCTURE
DIFFRACTION
ELECTROMAGNETIC RADIATION
ELEMENTS
ENERGY RANGE
HEAT TREATMENTS
INTERFACES
ION IMPLANTATION
IONS
KEV RANGE
KEV RANGE 10-100
MEDIUM TEMPERATURE
RADIATIONS
SCATTERING
SEMIMETALS
SILICON
SORPTION
STRUCTURE FACTORS
SYNCHROTRON RADIATION
X-RAY DIFFRACTION