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Evaluation of ITO/GaAs solar cells

Journal Article · · J. Vac. Sci. Technol.; (United States)
DOI:https://doi.org/10.1116/1.571479· OSTI ID:5489468
Heterojunction solar cells have low-cost potential for meeting the long term economic goals for the photovoltaic technology. In this paper, a critical technical evaluation of the ITO/GaAs solar cell is presented, emphasizing the factors limiting the performance of the device. The devices are fabricated on p-type (Be-doped) GaAs grown by MBE, with the ITO deposited by ion beam techniques. Light and dark J-V characteristics are presented and compared for these devices. The formation of buried homojunctions is postulated for cells damaged due to ion beam deposition, leading to higher V/sub oc/ and low J/sub sc/. Heterojunction formation is found for minimally disrupted GaAs surfaces. AES depth profiles are used to evaluate the chemical width of the ITO/GaAs interfaces. Electrical data characterizing the ITO/GaAs interface are obtained using EBIC, C-V and intensity dependent V/sub o/c-J/sub s/c characteristics.
Research Organization:
Photovoltaic Devices and Measurements Branch, Solar Energy Research Institute, Golden, Colorado 80401
OSTI ID:
5489468
Journal Information:
J. Vac. Sci. Technol.; (United States), Journal Name: J. Vac. Sci. Technol.; (United States) Vol. 20:3; ISSN JVSTA
Country of Publication:
United States
Language:
English