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Reactively sputtered TeO/sub x/ thin films for optical recording systems

Journal Article · · J. Vac. Sci. Technol., A; (United States)
DOI:https://doi.org/10.1116/1.575435· OSTI ID:5484605

Tellurium suboxide (TeO/sub x/ ) thin films have been obtained by rf reactive sputtering deposition by using a Te target and an Ar--O/sub 2/ gas mixture. Different samples were prepared by changing both the rf power (80--200 W) and the oxygen concentration in the sputtering gas. The transmissivity and the reflectivity of these films change markedly by thermal treatment at critical temperatures in the range 120--150 /sup 0/C. This property makes these films suitable for optical disk recording with a low-output power laser diode.

Research Organization:
Dipartimento di Fisica, Universita di Lecce, Italy, and Centro Interuniversitario di Struttura della Materia, CISM, Italy
OSTI ID:
5484605
Journal Information:
J. Vac. Sci. Technol., A; (United States), Journal Name: J. Vac. Sci. Technol., A; (United States) Vol. 6:2; ISSN JVTAD
Country of Publication:
United States
Language:
English

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