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Current suppression induced by conduction-band discontinuity in Al/sub 0. 35/Ga/sub 0. 65/As-GaAs N-p heterojunction diodes

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.327853· OSTI ID:5454017

Curent suppression in Al/sub 0.35/Ga/sub 0.65/As-GaAs N-p heterojunctions is observed experimentally. The data are explained by examining the carrier transport modified by electron accumulation in the interface potential notch resulting from the conduction-band discontinuity. In addition, it is found that the temperature dependent I-V measurements can be used to deduce the magnitude of ..delta..E/sub C/ at the junction interface.

Research Organization:
Department of Electrical Engineering, Columbia University, New York, New York 10027
OSTI ID:
5454017
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 51:4; ISSN JAPIA
Country of Publication:
United States
Language:
English