Chemistry and electronic structure of the H[sub 2] plasma passivated surface of CdTe

Journal Article · Tue Feb 01 04:00:00 EST 1994 · Journal of Applied Physics; (United States)

DOI:https://doi.org/10.1063/1.356376· OSTI ID:5437706

Nelson, A J ^[1]; Frigo, S P ^[2]; Rosenberg, R A ^[3]

---

1. National Renewable Energy Laboratory, Golden, Colorado 80401 (United States)
2. Synchrotron Radiation Center, University of Wisconsin-Madison, Stoughton, Wisconsin 53589 (United States)
3. Argonne National Laboratory/Advanced Photon Source, Argonne, Illinois 60439 (United States)

The effects of low energy H[sub 2] plasma exposure on the surface defect chemistry and the electronic structure of CdTe were studied by synchrotron radiation soft x-ray photoemission spectroscopy and optical emission spectroscopy as a function of substrate temperature. The low energy H[sub 2] plasma was generated with a commercial electron cyclotron resonance plasma source using pure H[sub 2] with the plasma exposure being performed at ambient temperature, 100 [degree]C, and 200 [degree]C. Plasma species were identified with optical emission spectroscopy. [ital In] [ital situ] photoemission measurements were acquired after each plasma exposure in order to observe changes in the valence band electronic structure as well as changes in the Cd 4[ital d] and Te 4[ital d] core lines. The results were correlated in order to relate the plasma species and characteristics to changes in surface defect chemistry and electronic structure. These measurements indicate that the H[sub 2] plasma exposure type converts the CdTe(100) surface from [ital p]- to [ital n]-type and passivates defect states.

• DOE Contract Number: AC02-83CH10093
• OSTI ID: 5437706
• Journal Information: Journal of Applied Physics; (United States), Journal Name: Journal of Applied Physics; (United States) Vol. 75:3; ISSN JAPIAU; ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360606* -- Other Materials-- Physical Properties-- (1992-)
CADMIUM COMPOUNDS
CADMIUM TELLURIDES
CHALCOGENIDES
DEFECTS
ELECTRONIC STRUCTURE
ELEMENTS
EMISSION
EMISSION SPECTROSCOPY
HYDROGEN
NONMETALS
PASSIVATION
PHOTOEMISSION
PLASMA
SECONDARY EMISSION
SPECTROSCOPY
SURFACE PROPERTIES
SURFACE TREATMENTS
TELLURIDES
TELLURIUM COMPOUNDS