X-ray diffraction study of clusters in a-tC films
Conference
·
OSTI ID:53675
- Kent State Univ., Kent, OH (United States). Dept. of Physics
- Sandia National Lab., Albuquerque, NM (United States)
- Drexel Univ., Philadelphia, PA (United States). Dept. of Physics
- Univ. of Pennsylvania, Philadelphia, PA (United States). Dept. of Electrical Engineering
The authors performed an X-ray diffraction study of tetrahedral-coordinated-amorphous carbon (a-tC) films prepared by pulsed laser deposition (PLD). Samples properties were analyzed as a function of laser energy and thickness. For all thicknesses and laser energies, films were made up of clusters with a basic unit size of 7 - 11 nm. Thicker films, as well as films prepared at higher laser densities exhibit larger clusters, in the tens of nanometers. The clusters are not readily observable by AFM, which may indicate the presence of a flat (graphitized) top film surface.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 53675
- Report Number(s):
- SAND--94-2987C; CONF-941144--144; ON: DE95010860
- Country of Publication:
- United States
- Language:
- English
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