Cumulative disorder and x-ray line broadening in multilayers

Journal Article · Wed Oct 15 04:00:00 EDT 1986 · Phys. Rev. B: Condens. Matter; (United States)

DOI:https://doi.org/10.1103/PhysRevB.34.5955· OSTI ID:5284299

Sevenhans, W; Gijs, M; Bruynseraede, Y; Homma, H; Schuller, I K

We have measured the high-angle x-ray diffraction from crystalline Pb--amorphous Ge multilayers. The experimental data in conjunction with a model calculation for the fluctuation in amorphous-layer thickness show that this fluctuation is larger than about 5%. A smaller thickness variation implies the existence of high-angle peaks which have not been observed in any amorphous-crystalline multilayers.

• Research Organization: Laboratorium voor Vaste Stof Fysika en Magnetisme, Katholieke Universiteit Leuven, B-3030 Leuven, Belgium
• OSTI ID: 5284299
• Journal Information: Phys. Rev. B: Condens. Matter; (United States), Journal Name: Phys. Rev. B: Condens. Matter; (United States) Vol. 34:8; ISSN PRBMD
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360102* -- Metals & Alloys-- Structure & Phase Studies
ALUMINIUM
COHERENT SCATTERING
DIFFRACTION
DIMENSIONS
ELEMENTS
FLUCTUATIONS
LEAD
LINE BROADENING
METALS
SCATTERING
THICKNESS
VARIATIONS
X-RAY DIFFRACTION