Measurement of subpicosecond electron pulse length

Journal Article · Wed Jan 01 04:00:00 EST 1997 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.52277· OSTI ID:526799

Lihn, H ^[1]

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1. Applied Physics Department and Stanford Linear Accelerator Center Stanford University, Stanford, California 94305 (United States)

A new frequency-resolved bunch-length measuring system has been developed at the Stanford SUNSHINE facility to characterize subpicosecond electron pulses. Using a far-infrared Michelson interferometer, this method measures the spectrum of coherent transition radiation emitted from electron bunches through optical autocorrelation. The electron bunch length is obtained from the measurement with a simple and systematic analysis that includes interference effects caused by the beam splitter. This method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods. The principle of this method and experimental results are discussed. {copyright} {ital 1997 American Institute of Physics.}

• Research Organization: Stanford Linear Accelerator Center
• DOE Contract Number: AC03-76SF00515
• OSTI ID: 526799
• Report Number(s): CONF-9605173--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 390; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
BEAM BUNCHING
BEAM MONITORS
CORRELATION FUNCTIONS
ELECTRON BEAMS
INFRARED SPECTRA
MEV RANGE
MICHELSON INTERFEROMETER
PULSE ANALYZERS
PULSE TECHNIQUES