Measurement of subpicosecond electron pulse length

Conference · Mon Apr 01 04:00:00 EST 1996

OSTI ID:258145

Lihn, Hung chi

A new frequency-resolved bunch-length measuring system has been developed at the Stanford SUNSHINE facility to characterize subpicosecond electron pulses. Using a far-infrared Michelson interferometer, this method measures the spectrum of coherent transition radiation emitted from electron bunches through optical autocorrelation. The electron bunch length is obtained from the measurement with a simple and systematic analysis which includes interference effects caused by the beam splitter. This method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods. The principle of this method and experimental results are discussed.

• Research Organization: Stanford Linear Accelerator Center, Menlo Park, CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC03-76SF00515
• OSTI ID: 258145
• Report Number(s): SLAC-PUB--7158; CONF-9605173--4; ON: DE96012579
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
BEAM BUNCHING
BEAM SPLITTING
COHERENT RADIATION
ELECTRON BEAMS
MEASURING METHODS
MICHELSON INTERFEROMETER
PULSES