Measurement of subpicosecond electron bunch lengths

Conference · Wed Nov 01 04:00:00 EST 1995

OSTI ID:135542

Lihn, Hung-chi; Bocek, D; Kung, P; Settakorn, C; Wiedemann, H

A new frequency-resolved bunch-length measuring system has been developed at the Stanford SUNSHINE facility suitable for subpicosecond electron bunches. This method utilizes a far-infrared Michelson interferometer to measure coherent transition radiation emitted from electron bunches through optical auto-correlation. A simple and systematic way has also been developed to include interference effects caused by the beam splitter, so the electron bunch length can be easily obtained from the measurement. This autocorrelation method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods.

• Research Organization: Stanford Linear Accelerator Center, Menlo Park, CA (United States)
• Sponsoring Organization: USDOE, Washington, DC (United States)
• DOE Contract Number: AC03-76SF00515
• OSTI ID: 135542
• Report Number(s): SLAC-PUB--95-7052; CONF-9509227--8; ON: DE96002810
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
66 PHYSICS
BEAM BUNCHING
BEAM MONITORING
BEAM SPLITTING
ELECTRON BEAMS
ELECTRON CORRELATION
MICHELSON INTERFEROMETER
TRANSITION RADIATION