Measurement of subpicosecond electron bunch lengths

Journal Article · Mon Apr 01 04:00:00 EST 1996 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.50282· OSTI ID:288368

Lihn, H ^[1]; Bocek, D ^[2]; Kung, P; Settakorn, C; Wiedemann, H ^[1]

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1. Applied Physics Department, and SSRL/SLAC, Stanford University, P.O. Box 4349, Stanford, California 94309 (United States)
2. Physics Department, and SSRL/SLAC, Stanford University, P.O. Box 4349, Stanford, California 94309 (United States)

A new frequency-resolved bunch-length measuring system has been developed at the Stanford SUNSHINE facility suitable for subpicosecond electron bunches. This method utilizes a far-infrared Michelson interferometer to measure coherent transition radiation emitted from electron bunches through optical autocorrelation. A simple and systematic way has also been developed to include interference effects caused by the beam splitter, so the electron bunch length can be easily obtained from the measurement. This autocorrelation method demonstrates subpicosecond resolving power that cannot be achieved by existing time-resolved methods. {copyright} {ital 1996 American Institute of Physics.}

• Research Organization: Stanford Linear Accelerator Center
• DOE Contract Number: AC03-76SF00515
• OSTI ID: 288368
• Report Number(s): CONF-9509227--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 367; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
AUTOCORRELATIONS
BEAM ANALYZERS
BEAM BUNCHING
BEAM SPLITTING
COHERENT RADIATION
ELECTRON BEAMS
FAR INFRARED RADIATION
FREQUENCY ANALYSIS
MICHELSON INTERFEROMETERS
TRANSITION RADIATION