Optical constants for 22 thin film materials in the 10 eV to 500 eV photon energy region

Conference · Thu Jan 01 04:00:00 EST 1987

OSTI ID:5222432

Windt, D L; Cash, W; Scott, M; Arendt, P; Newnam, B; Fisher, R F; Swartzlander, A B; Takacs, P Z; Pinnco, J M; Kortright, J B

Reflectance measurements were used to derive the optical constants of 22 materials for 36 photon wavelengths from 24 )Angstrom) to 1216 )Angstrom). The samples studied are thin films of the transition metals Ti, Zr, Nb, Mo, Ru, Rh, Pd, Hf, Ta, W, Re, Os, Ir, and Pt, the noble metals Ag and Au, and films of C, diamond, Al, Si, CVD-SiC and a-SiC. We describe the experiment and also the data reduction technique used to derive the optical constants from the reflectance versus incidence angle data. A summary of the results is presented. 4 figs., 12 refs.

• Research Organization: Lockheed Palo Alto Research Labs., CA (USA); Colorado Univ., Boulder (USA); Los Alamos National Lab., NM (USA); Solar Energy Research Inst., Golden, CO (USA); Brookhaven National Lab., Upton, NY (USA); Crystallume, Inc., Palo Alto, CA (USA); Lawrence Berkeley Lab., CA (USA)
• DOE Contract Number: AC02-76CH00016
• OSTI ID: 5222432
• Report Number(s): BNL-41065; CONF-8708110-35; ON: DE88007971
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
360603 -- Materials-- Properties
ALUMINIUM
CARBIDES
CARBON
CARBON COMPOUNDS
DIAMONDS
ELEMENTAL MINERALS
ELEMENTS
FILMS
GOLD
METALS
MINERALS
NONMETALS
OPTICAL PROPERTIES
PHYSICAL PROPERTIES
REFLECTION
SILICON CARBIDES
SILICON COMPOUNDS
SILVER
THIN FILMS
TRANSITION ELEMENTS