Optical properties of 21 thin-film materials in the 10 eV to 500 eV photon energy region
Thesis/Dissertation
·
OSTI ID:5071007
Reflectance measurements were used to derive the optical constants of 21 materials for 36 wavelengths from 24 to 1216 A. The samples studied are evaporated thin films of the transition metals, Ti, Zr, Nb, Mo, Ru, Rh, Pd, Hf, Ta, W, Re, Os, Ir, and Pt, the noble metals Ag and Au, and films of C, diamond, Al, Si, and SiC. The reflectometer used enables measurements to be performed from near normal incidence to grazing incidence, and is computer controlled, so that for each sample the reflectance was measured at many incidence angles; typically sixteen angles between 10/sup 0/ and 85/sup 0/ for wavelengths greater than 200 A, and ten or more grazing angles for wavelengths below 200 A. The optical constants, n and k, were determined from the reflectance versus angle of incidence data using a non-linear least squares curve-fitting technique based on the X/sup 2/ test of fit. This method also provides a direct approach for estimating the probably errors in the derived optical constants. Optical constants and related optical functions are presented for each of the 21 materials measured, thereby providing a set of optical data, determined from a single technique, that covers the photon energy range 10 eV to 500 eV.
- Research Organization:
- Colorado Univ., Boulder (USA)
- OSTI ID:
- 5071007
- Country of Publication:
- United States
- Language:
- English
Similar Records
Optical constants for 22 thin film materials in the 10 eV to 500 eV photon energy region
Optical constants for thin films of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Ir, Os, Pt, and Au from 24 A to 1216 A
Optical constants for thin films of C, diamond, Al, Si, and CVD SiC from 24 A to 1216 A
Conference
·
Wed Dec 31 23:00:00 EST 1986
·
OSTI ID:5222432
Optical constants for thin films of Ti, Zr, Nb, Mo, Ru, Rh, Pd, Ag, Hf, Ta, W, Re, Ir, Os, Pt, and Au from 24 A to 1216 A
Journal Article
·
Thu Jan 14 23:00:00 EST 1988
· Appl. Opt.; (United States)
·
OSTI ID:5485302
Optical constants for thin films of C, diamond, Al, Si, and CVD SiC from 24 A to 1216 A
Journal Article
·
Thu Jan 14 23:00:00 EST 1988
· Appl. Opt.; (United States)
·
OSTI ID:5373071
Related Subjects
36 MATERIALS SCIENCE
360104* -- Metals & Alloys-- Physical Properties
360603 -- Materials-- Properties
ALUMINIUM
CARBIDES
CARBON
CARBON COMPOUNDS
DATA
DIAMONDS
ELEMENTAL MINERALS
ELEMENTS
ENERGY RANGE
EV RANGE
EV RANGE 10-100
EV RANGE 100-1000
EXPERIMENTAL DATA
FILMS
GOLD
HAFNIUM
INFORMATION
IRIDIUM
MEASURING METHODS
METALS
MINERALS
MOLYBDENUM
NIOBIUM
NONMETALS
NUMERICAL DATA
OPTICAL PROPERTIES
OSMIUM
PALLADIUM
PHYSICAL PROPERTIES
PLATINUM
PLATINUM METALS
RHENIUM
RHODIUM
RUTHENIUM
SEMIMETALS
SILICON
SILICON CARBIDES
SILICON COMPOUNDS
SILVER
SPECTRAL REFLECTANCE
TANTALUM
THIN FILMS
TITANIUM
TRANSITION ELEMENTS
TUNGSTEN
ZIRCONIUM
360104* -- Metals & Alloys-- Physical Properties
360603 -- Materials-- Properties
ALUMINIUM
CARBIDES
CARBON
CARBON COMPOUNDS
DATA
DIAMONDS
ELEMENTAL MINERALS
ELEMENTS
ENERGY RANGE
EV RANGE
EV RANGE 10-100
EV RANGE 100-1000
EXPERIMENTAL DATA
FILMS
GOLD
HAFNIUM
INFORMATION
IRIDIUM
MEASURING METHODS
METALS
MINERALS
MOLYBDENUM
NIOBIUM
NONMETALS
NUMERICAL DATA
OPTICAL PROPERTIES
OSMIUM
PALLADIUM
PHYSICAL PROPERTIES
PLATINUM
PLATINUM METALS
RHENIUM
RHODIUM
RUTHENIUM
SEMIMETALS
SILICON
SILICON CARBIDES
SILICON COMPOUNDS
SILVER
SPECTRAL REFLECTANCE
TANTALUM
THIN FILMS
TITANIUM
TRANSITION ELEMENTS
TUNGSTEN
ZIRCONIUM