Characterization of thin films of Y-Ba-Cu-O on oxidized silicon with a zirconia buffer layer

Journal Article · Mon Jun 13 04:00:00 EDT 1988 · Appl. Phys. Lett.; (United States)

DOI:https://doi.org/10.1063/1.99749· OSTI ID:5221098

Mogro-Campero, A; Turner, L G; Hall, E L; Burrell, M C

Thin films of the high-temperature superconductor Y-Ba-Cu-O with zero-resistance transition temperatures up to 83 K have been recently reported by using a zirconia buffer layer on the primary materials of interest for electronics, Si and SiO/sub 2/. In this letter, various characteristics of these films are discussed. Microstructural analysis using transmission electron microscopy shows the complex morphology of the unoriented polycrystalline films. Elemental depth profiling by x-ray photoelectron spectroscopy shows the effectiveness of the zirconia buffer layer in preventing interdiffusion; fluorine is found throughout the film at an abundance of 4 at. % The critical current density was measured as a function of temperature; its value is 5 kA cm/sup -2/ at 4.2 K.

• Research Organization: GE Research and Development Center, Schenectady, New York 12301
• OSTI ID: 5221098
• Journal Information: Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 52:24; ISSN APPLA
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202 -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204* -- Ceramics
Cermets
& Refractories-- Physical Properties
656100 -- Condensed Matter Physics-- Superconductivity
75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ALKALINE EARTH METAL COMPOUNDS
ATOM TRANSPORT
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
COPPER COMPOUNDS
COPPER OXIDES
CRITICAL CURRENT
CRYSTAL STRUCTURE
CURRENT DENSITY
CURRENTS
DATA
DIFFUSION
DIFFUSION BARRIERS
ELECTRIC CURRENTS
ELECTRON MICROSCOPY
ELECTRON SPECTROSCOPY
ELEMENTS
EXPERIMENTAL DATA
FILMS
FLUORINE
HALOGENS
INFORMATION
LOW TEMPERATURE
MICROSCOPY
MICROSTRUCTURE
MINERALS
MORPHOLOGY
NEUTRAL-PARTICLE TRANSPORT
NONMETALS
NUMERICAL DATA
OXIDE MINERALS
OXIDES
OXYGEN COMPOUNDS
PHOTOELECTRON SPECTROSCOPY
RADIATION TRANSPORT
SEMIMETALS
SILICA
SILICON
SILICON COMPOUNDS
SILICON OXIDES
SPECTROSCOPY
SUPERCONDUCTING FILMS
THIN FILMS
TRANSITION ELEMENT COMPOUNDS
TRANSMISSION ELECTRON MICROSCOPY
YTTRIUM COMPOUNDS
YTTRIUM OXIDES
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES