High critical currents in Y-Ba-Cu-O films on silicon using YSZ buffer layers

Conference · Fri Mar 01 04:00:00 EST 1991 · IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:5877277

Fenner, D B; Fork, D K; Connell, G A.N.; Boyce, J B; Viano, A M ^[1]; Geballe, T H ^[2]

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1. Xerox Palo Alto Research Center, CA (United States)
2. Stanford Univ., CA (United States). Dept. of Applied Physics

Exceptionally high quality films of Y{sub 1}Ba{sub 2}Cu{sub 3}O{sub 7{minus}x} (YBCO) were successfully grown epitaxially on Si(100) wafers with a buffer layer of yttria-stabilized zirconia (YSZ) using a fully in-situ pulsed laser deposition (PLD) process. Critical current densities of a 30-nm thick film are 2 {times} 10{sup 7} at 4.2 K and 2.2 {times} 10{sup 6} at 77 K. Zero- resistance critical temperatures are about 87 K, the transition width is 1 K, and normal-state resistivity is 0.28 mOhm-cm at 300 K. In this paper the authors describe the crystallographic and chemical structure of the interfaces and their role in film formation. The crystal quality of YSZ buffer layers on Si is not degraded by decomposition reactions, as is YBCO directly on Si or SiO{sub 2}, and cube- on-cube orientation of the YSZ cubic fluorite on Si(100) surfaces can be made to occur very effectively.

• OSTI ID: 5877277
• Report Number(s): CONF-900944--
• Conference Information: Journal Name: IEEE Transactions on Magnetics (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 27:2
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
360202* -- Ceramics
Cermets
& Refractories-- Structure & Phase Studies
360204 -- Ceramics
Cermets
& Refractories-- Physical Properties
37 INORGANIC, ORGANIC, PHYSICAL, AND ANALYTICAL CHEMISTRY
400100 -- Analytical & Separations Chemistry
ALKALINE EARTH METAL COMPOUNDS
BARIUM COMPOUNDS
BARIUM OXIDES
CHALCOGENIDES
CHEMICAL ANALYSIS
COHERENT SCATTERING
COPPER COMPOUNDS
COPPER OXIDES
CRITICAL CURRENT
CRYSTAL STRUCTURE
CRYSTALLOGRAPHY
CURRENT DENSITY
CURRENTS
DEPOSITION
DIFFRACTION
ELECTRIC CURRENTS
ELEMENTS
EPITAXY
FILMS
FLUORITE
GRAIN ORIENTATION
HALIDE MINERALS
INTERFACES
MICROSTRUCTURE
MINERALS
ORIENTATION
OXIDES
OXYGEN COMPOUNDS
SCATTERING
SEMIMETALS
SILICON
STRAINS
SUBSTRATES
SUPERCONDUCTING FILMS
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION
YTTRIUM COMPOUNDS
YTTRIUM OXIDES
ZIRCONIUM COMPOUNDS
ZIRCONIUM OXIDES