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Improvement of GaAs-GaAlAs double-heterostructure laser wafer by Ga/sub 1-x/Al/sub x/As buffer layer

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.91990· OSTI ID:5199093
The optically induced degradation in GaAs-GaAlAs double-heterostructure (DH) laser wafers is examined at elevated temperatures. The degradation of the photoluminescence properties by optical pumping is considered to originate at the interface between an n-GaAlAs clad layer and a p-GaAs active layer, as it is greatly reduced by the insertion of a thin Ga/sub 1-x/Al/sub x/As buffer layer (xapprox.0.05, approx.0.05 ..mu..m thick) between these two layers. The degradation rate during optical pumping is correlated to laser life. The lasers fabricated from the DH wafers with the Ga/sub 1-x/Al/sub x/As buffer layer are still operating after 2000 h at 70 /sup 0/C, whereas lasers without the buffer layer are inoperative after a few hundred hours.
Research Organization:
Fujitsu Labs., 1015 Kamikodanaka, Nakahara-ku, Kawasaki 211, Japan
OSTI ID:
5199093
Journal Information:
Appl. Phys. Lett.; (United States), Journal Name: Appl. Phys. Lett.; (United States) Vol. 37:6; ISSN APPLA
Country of Publication:
United States
Language:
English