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Title: Threshold temperature dependence of subnanosecond optically excited 1. 3-. mu. m InGaAsP lasers

Journal Article · · Appl. Phys. Lett.; (United States)
DOI:https://doi.org/10.1063/1.94846· OSTI ID:5179724

We report the first measurement of the temperature dependence of the relative threshold carrier density, N/sub th/, in InGaAsP-InP lasers. The characteristic temperature T/sup prime//sub 0/, defined by 1/T/sup //sub 0/ equivalentd ln N/sub th//dT, which is independent of nonradiative recombination mechanisms, is determined by transient pumping of a simple double heterostructure laser with optical pulses short (approx. =100 ps) compared to the carrier lifetime (2--3 ns). A single T/sup prime//sub 0/ as large as 120 K describes an exponential threshold dependence on temperature over a wide temperature range (160--370 K). Comparison with steady state (300 ns) excitation of the same samples shows that nonradiative recombination is responsible for the commonly observed injection laser break from a low-temperature T/sub 0/approx. =100 K to the poorer room-temperature T/sub 0/approx. =65 K. The measured T/sup //sub 0/ is smaller than a previously calculated value of approximately 200 K.

Research Organization:
Bell Laboratories, Holmdel, New Jersey 07733
OSTI ID:
5179724
Journal Information:
Appl. Phys. Lett.; (United States), Vol. 44:6
Country of Publication:
United States
Language:
English