Photometric calibration of soft x-ray and p -terphenyl coated visible photodiodes in the 180--1500 eV range for fusion plasma spectroscopy

Journal Article · Fri Nov 01 04:00:00 EST 1991 · Review of Scientific Instruments; (United States)

DOI:https://doi.org/10.1063/1.1142205· OSTI ID:5125920

Stutman, D; Kovnovich, S; Finkenthal, M ^[1]; Zwicker, A; Moos, H W ^[2]

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1. Racah Institute of Physics, The Hebrew University, Jerusalem (Israel)
2. Department of Physics and Astronomy, The Johns Hopkins University, Baltimore, Maryland (USA)

The efficiencies of x-ray ultraviolet silicon, and {ital p}-terphenyl coated visible photodiodes have been measured in the 180--1500 eV range using a {ital K} radiation-Manson source. It is found that the quantum efficiency (electrons/photon) of the silicon diode varies between 25 and 400 in the above-mentioned range; the {ital p}-terphenyl coated diode is by two orders of magnitude less performing at the high-energy end of the range considered, but approaches the efficiency of the silicon diode at 100 A. Such diodes with built-in amplifiers, coated with scintillator and thin layers of metal films, can be efficiently used in spectroscopic diagnostics of magnetically confined plasmas.

• DOE Contract Number: FG02-86ER53214
• OSTI ID: 5125920
• Journal Information: Review of Scientific Instruments; (United States), Journal Name: Review of Scientific Instruments; (United States) Vol. 62:11; ISSN RSINA; ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

440600 -- Optical Instrumentation-- (1990-)
47 OTHER INSTRUMENTATION
70 PLASMA PHYSICS AND FUSION TECHNOLOGY
700102* -- Fusion Energy-- Plasma Research-- Diagnostics
AMPLIFIERS
CALIBRATION
COATINGS
EFFICIENCY
ELECTROMAGNETIC RADIATION
ELECTRONIC EQUIPMENT
EQUIPMENT
IONIZING RADIATIONS
PHOTODETECTORS
PHOTODIODES
PLASMA DIAGNOSTICS
QUANTUM EFFICIENCY
RADIATIONS
SEMICONDUCTOR DEVICES
SEMICONDUCTOR DIODES
SOFT X RADIATION
X RADIATION