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Low-threshold disorder-defined buried-heterostructure Al/sub x/Ga/sub 1-x/As-GaAs quantum well lasers

Journal Article · · J. Appl. Phys.; (United States)
DOI:https://doi.org/10.1063/1.336265· OSTI ID:5031610

Two different quantum well heterostructure wafers are used to fabricate buried-heterostructure Al/sub x/Ga/sub 1-x/As-GaAs quantum well lasers using Si-induced layer disordering (via Si diffusion). In contrast to the first wafer (QWH1), the second quantum well wafer (QWH2) utilizes Zn instead of Mg as the p-type dopant in the top Al/sub x/Ga/sub 1-x/As confining layer and yields, because of concentration mismatch in acceptor and donor doping in the confining layers (n/sub Zn/>n/sub Se/), inferior laser diodes owing to Zn diffusion from the p-type to the n-type confining layer during high temperature processing (850 /sup 0/C Si diffusion). The first quantum well heterostructure, however, employs a lower concentration Mg doping for its p-type confining layer (n/sub Mg/

Research Organization:
Electrical Engineering Research Laboratory and Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801
OSTI ID:
5031610
Journal Information:
J. Appl. Phys.; (United States), Journal Name: J. Appl. Phys.; (United States) Vol. 58:12; ISSN JAPIA
Country of Publication:
United States
Language:
English