A proposed hardness assurance test methodology for bipolar linear circuits and devices in a space ionizing radiation environment
Conference
·
OSTI ID:484583
- RLP Research, Albuquerque, NM (United States)
- Naval Research Lab., Washington, DC (United States)
- Defense Special Weapons Agency, Alexandria, VA (United States); and others
A hardness assurance test approach has been developed for bipolar linear circuits and devices in space. It consists of a screen for dose rate sensitivity and a characterization test method to develop the conditions for a lot acceptance test at high dose rate.
- Research Organization:
- Sandia National Labs., Albuquerque, NM (United States)
- Sponsoring Organization:
- USDOE, Washington, DC (United States)
- DOE Contract Number:
- AC04-94AL85000
- OSTI ID:
- 484583
- Report Number(s):
- SAND--97-0808C; CONF-970711--7; ON: DE97004627
- Country of Publication:
- United States
- Language:
- English
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