Evaluation of proposed hardness assurance method for bipolar linear circuits with enhanced low dose rate sensitivity (ELDRS)

Journal Article · Tue Dec 01 04:00:00 EST 1998 · IEEE Transactions on Nuclear Science

DOI:https://doi.org/10.1109/23.736512· OSTI ID:323945

Pease, R L ^[1]; Gehlhausen, M; Krieg, J; Titus, J; Turflinger, T; Emily, D ^[2]; Cohn, L ^[3]

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1. RLP Research, Albuquerque, NM (United States)
2. Naval Surface Warfare Center, Crane, IN (United States)
3. Defense Special Weapons Agency, Alexandria, VA (United States)

Data are presented on several low dose rate sensitive bipolar linear circuits to evaluate a proposed hardness assurance method. The circuits include primarily operational amplifiers and voltage comparators with a variety of sensitive components and failure modes. The proposed method, presented in 1997, includes an option between a low dose rate test at 10 mrd(Si)/s and room temperature and a 100 C elevated temperature irradiation test at a moderate dose rate. The results of this evaluation demonstrate that a 10 mrd(Si)/s test is able (in all but one case) to bound the worst case response within a factor of 2. For the moderate dose rate, 100 C test the worst case response is within a factor of 3 for 8 of 11 circuits, and for some circuits overpredicts the low dose rate response. The irradiation bias used for these tests often represents a more degrading bias condition than would be encountered in a typical space system application.

• OSTI ID: 323945
• Report Number(s): CONF-980705--
• Journal Information: IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 45; ISSN IETNAE; ISSN 0018-9499
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
AMBIENT TEMPERATURE
DOSE RATES
INTEGRATED CIRCUITS
PHYSICAL RADIATION EFFECTS
SENSITIVITY
TEMPERATURE RANGE 0273-0400 K
TESTING