INDUSTRIAL APPLICATIONS OF THE FLUORESCENT $beta$-RAY EXCITED X-RAYS. IV. THE MEASUREMENT ON THE FLUORESCENT X-RAYS WITH A SCINTILLATION COUNTER

Journal Article · Mon Aug 01 04:00:00 EDT 1960 · Nagoya Kogyo Gijutsu Shikenjo Hokoku

OSTI ID:4836914

Enomoto, S; Mori, C

The detection efficiency and energy resolution of a NaI scintillation counter for measuring the fluorescent K x-rays excited by Sr/sup 90/-Y/sup 90/ BETA rays were determined experimentally, and some applications of the K x-ray measurements are presented. Results showed that the low energy x-rays below about 100 kev can be detected efficientiy with a thin NaI scintillator, which eliminates the effect of the high energy x rays. A separation of 3 or 4 atomic number units is nec essary to resolve elements which have the atomic number larger than 40. For example, the resolution of the counter was about 35% for the tin K x ray (25 kev). The K x ray purity ratio, which was increased by using a thin scintillator, was about 50% for the element of the above mentioned atomic number with a 2-mm thick scintillator. The thickness of Cd deposits on Cu less than 10 mu was determined, and the contents of a solder were analyzed also. (OID)

• Research Organization: Originating Research Org. not identified
• NSA Number: NSA-16-022507
• OSTI ID: 4836914
• Journal Information: Nagoya Kogyo Gijutsu Shikenjo Hokoku, Journal Name: Nagoya Kogyo Gijutsu Shikenjo Hokoku Vol. Vol: 9
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

BETA PARTICLES
CADMIUM
COPPER
DETECTION
EFFICIENCY
ENERGY
ENERGY LEVELS
EXCITATION
FLUORESCENCE
INDUSTRIAL APPLICATIONS OF ISOTOPES AND RADIATIONS
MEASURED VALUES
PLATING
QUANTITATIVE ANALYSIS
SCINTILLATION COUNTERS
SODIUM IODIDES
STRONTIUM 90
THICKNESS
USES
X RADIATION
YTTRIUM 90