INDUSTRIAL APPLICATION OF $beta$-RAY EXCITED X-RAYS. VII. FLUORESCENT X- RAY ANALYSIS

Journal Article · Sat Jul 01 04:00:00 EDT 1961 · Nagoya Kogyo Gijutsu Shikenjo Hokoku

OSTI ID:4826506

Enomoto, S; Mori, C

The fluorescent x-ray analysis by means of a BETA -ray source was applied to binary alloy analysis and to coating thickness measurements. The K x- ray radiation obtained from an element by bombardment with BETA rays from 10 mc of Sr/sup 90/-Y/sup 90/ was detected by a folder or a pulse height analyzer and studied with a gas-flow proportional counter. The scattered BETA rays from the sample were removed by an electromagnet arrangement in front of the counter window. The exper-imental r-esults showed that the scattered BETA rays were removed efficiently using Husain's experimental formula; the Cu- Zn alloy analysis using Ni l2 to 36 mu thick Rave a straight line calibration curve within 2% accuracy; within 0.5% for Cu-Sr containing more than 80% Cu using the pulse height analyzer; and up to l0 mu of Cr deposit can be determined with a 2% accuracy if the thickness is less than 4 mu . (OID)

• Research Organization: Originating Research Org. not identified
• NSA Number: NSA-16-022508
• OSTI ID: 4826506
• Journal Information: Nagoya Kogyo Gijutsu Shikenjo Hokoku, Journal Name: Nagoya Kogyo Gijutsu Shikenjo Hokoku Vol. Vol: 10
• Country of Publication: Country unknown/Code not available
• Language: English

Related Subjects

BETA PARTICLES
CHROMIUM
COATING
COPPER ALLOYS
COUNTERS
ELECTROMAGNETISM
ELECTRON BEAMS
ELECTRON SOURCES
ELECTRONS
ENERGY LEVELS
FLUORESCENCE
GAS FLOW
INDUSTRIAL APPLICATIONS OF ISOTOPES AND RADIATIONS
MEASURED VALUES
NICKEL
PARTICLE SOURCES
PULSE ANALYZERS
SCATTERING
STRONTIUM 90
STRONTIUM COMPOUNDS
THICKNESS
X RADIATION
YTTRIUM 90
ZINC ALLOYS