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Title: B10 Diffused Junctions in N-Type Silicon

Journal Article · · IRE Transactions on Nuclear Science

Silicon diffused-junction detectors were prepared by dlffusion of boron- 10 into n-type silicon of resistivity 1000 to 3800 ohm-cm at a teraperature of 1000 deg C. Detector diameters ranged from 3 mm to 2 cm. With the junction edge exposed in air or in vacuum, these detectors were extremely unstable. The use of organic silanes and ordinary waxes as a coating on the exposed junction edge provided stability. For some detectors, the treatment with silanes was followed by a decrease in leakage current during subsequent storage. For alpha particles, a resolution width of 40 to 45 kev was obtained for 6 Mev alpha particles in a detector of diameter 3 to 4 mm. For 2-cm-diameter detectors, the resolution width at this energy was 80 to 1OO kev, but was reduced to 40 kev for alpha particles at a higher energy of 9 Mev. The peak-to-valley ratio for fission fragments from Cf/sup 252/ a was constant and equal to 1.40 at a detector reverse voltage of 15 volts or higher. The use of boron-1O allows identification of the energies of the products of fission reactions that occur within the detector, although similar detectors may be prepared using ordinary boron. For the present detectors the energies of the reaction products from the reaction n(B/sup 10/,Li) alpha and their sum were resolved with a resolution width of approximately 250 kev, and with energy corresponding to the known energies to within 5%. (auth)

Research Organization:
Argonne National Lab., Ill.
Sponsoring Organization:
USDOE
NSA Number:
NSA-16-023903
OSTI ID:
4806154
Report Number(s):
UAC-6130
Journal Information:
IRE Transactions on Nuclear Science, Vol. 9, Issue 3; Other Information: UAC-6130. Orig. Receipt Date: 31-DEC-62; ISSN 0096-2015
Country of Publication:
Country unknown/Code not available
Language:
English

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