APPARATUS FOR MEASURING THE THICKNESS OF A DEPOSIT
Patent
·
OSTI ID:4795606
A radiometric apparatas is designed for measuring deposit thicknesses. In this apparatus, a beam of beta rays is projected onto the deposit, and the excited x rays are detected in a frequency band including one of the x-ray characteristics of the deposit. The x-ray activity serves as an indication of the deposit thickness. A magnetic field is provided between the deposit and the detector means to block scattered beta rays. (D.L.C.)
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-17-000351
- Assignee:
- Commissariat a l'Energie Atomique
- Patent Number(s):
- US 3056027
- OSTI ID:
- 4795606
- Country of Publication:
- United States
- Language:
- English
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