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METHOD AND APPARATUS FOR MEASURING THE THICKNESS OF A DEPOSIT

Patent ·
OSTI ID:4233271
A method and device are given for measuring the thickness of a deposited layer of material. The device consists of: a beta source which excites the x-ray spectrum of the material whose thickness is to be measured, an x-ray filter to filter out all but a narrow band of the spectrum, and a scintillator and photomultiplier for measuring the intensity of x rays of selected energy. (T.R.H.)
Research Organization:
Originating Research Org. not identified
NSA Number:
NSA-13-016188
OSTI ID:
4233271
Report Number(s):
GB 816062
Country of Publication:
United Kingdom
Language:
English

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Related Subjects

ABSORPTION
BETA PARTICLES
DEPOSITS
ENERGY
EXCITATION
FILTERS
FREQUENCY
INSTRUMENTS
LAYERS
MEASURED VALUES
PATENT
PHOTOMULTIPLIERS
RADIATION SOURCES
SCINTILLATION COUNTERS
SPECTRA
THICKNESS