METHOD AND APPARATUS FOR MEASURING THE THICKNESS OF A DEPOSIT

Patent · Wed Jan 18 04:00:00 EST 1961

OSTI ID:4059237

A method is given for measuring the thickness of deposits, whereby the deposit is irradiated by electrons or beta rays, and x rays emitted by the deposit are detected as a function of the thickness. This method is a modification of that in Patent No. 816,062 to permit use with support and deposit metals having atomic numbers less than approximately 40 and differing from each other by only 2 or 3 units. In this method, the beta rays backscattered by the deposit are eliminated from the x rays by a magnetic field, and the x rays are detected by a gas-filled proportional counter. In the case of deposit and support metals having atomic numbers close together, the x rays emitted by both can be distinguished by means of a thin metallic film positioned in front of the counter. (D.L.C.)

• Research Organization: Originating Research Org. not identified
• NSA Number: NSA-15-014522
• OSTI ID: 4059237
• Report Number(s): GB 859153
• Country of Publication: United Kingdom
• Language: English

Related Subjects

ATOMIC NUMBER
BETA PARTICLES
COUNTERS
DEPOSITS
DETECTION
ELECTRON BEAMS
EMISSION
ENGINEERING AND EQUIPMENT
FILMS
INSTRUMENTS
MAGNETIC FIELDS
MEASURED VALUES
METALS
PROPORTIONAL COUNTERS
SCATTERING
THICKNESS
X RADIATION