IMPROVEMENTS IN OR RELATING TO A METHOD OF AND MEANS FOR MEASURING THICKNESSES OF DEPOSITS
Patent
·
OSTI ID:4110697
A device for measuring the thickness of metallic deposits by beta irradiation and detection of the resulting characteristic x-ray emission is designed which can be used on deposits of light metals. In this device, the sample to be irradiated is connected directly through a nonmagnetic tube with the proportional chamber, and the parasitic retrodiffused beta rays are eliminated by a magnetic field. (D.L.C.)
- Research Organization:
- Originating Research Org. not identified
- NSA Number:
- NSA-18-007021
- OSTI ID:
- 4110697
- Report Number(s):
- GB 945046
- Country of Publication:
- United Kingdom
- Language:
- English
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