The Determination of Impurities in SAP by X-Ray Spectrography; LE DOSAGE DES IMPURETES DANS LE SAP PAR SPECTROGRAPHIE DES RAYONS X
Technical Report
·
OSTI ID:4697146
S>The use of spectrographic standards of aluminum permits the rapid and nondestructive determination of Fe, Ni, Cu, Zn, Ga, V, Ti, Cr, and Mn in SAP with a detection sensitivity varying from 1 to 20 ppm, for a counting time of 64 seconds. Four samples with an amount of Al/sub 2/O/sub 3/ between 4 and 14% were analyzed. There seems to be satisfactory agreement with the analyses given by the suppliers, although the amount of impurities increases with the Al/sub 2/O/ sub 3/ concentration. (auth)
- Research Organization:
- European Atomic Energy Community. Nuclear Research Center, Ispra, Italy
- NSA Number:
- NSA-17-027226
- OSTI ID:
- 4697146
- Report Number(s):
- EUR-21.f
- Country of Publication:
- Country unknown/Code not available
- Language:
- English
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