Optical properties of the epitaxial Pb{sub 1{minus}x}La{sub x}TiO{sub 3} thin films grown by metalorganic chemical vapor deposition
- School of Physics, Georgia Institute of Technology, Atlanta, Georgia 30332 (United States)
The dispersion of the refractive indices for the epitaxial Pb{sub 1{minus}x}La{sub x}TiO{sub 3} thin films with x=0.28 and 0.23 grown on the MgO (100) and Al{sub 2}O{sub 3} (0001) substrates, respectively, has been investigated. The refractive indices in the wavelength range of 435{endash}1523 nm were measured by a prism coupling method. At a wavelength range of 632.8 nm, the refractive index of a PLT film grown with (100) orientation was determined to be 2.609. The transmission spectrum was used as an additional measurement for the dispersion of the refractive index and showed a good agreement with the prism coupling measurements. The dispersion of refractive index fits well to a single-term Sellmeier relation. {copyright} {ital 1997 American Institute of Physics.}
- OSTI ID:
- 463412
- Journal Information:
- Applied Physics Letters, Vol. 70, Issue 2; Other Information: PBD: Jan 1997
- Country of Publication:
- United States
- Language:
- English
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