Application of poly(methyl methacrylate) ultrathin resist supported by a flowing subphase method in electron-beam fabrication of a 4in. high-resolution mask
Journal Article
·
· Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena
- National Laboratory of Molecular and Biomolecular Electronics, Southeast University, Nanjing 210096 (China)
- Wuxi Huajing Electronic Corporation, Center for Fabrication of Mask, Wuxi 214061 (China)
A recently designed Langmuir trough using a steady-laminar flowing subphase is exploited to support polymer monolayers. The ultrathin poly(methyl methacrylate) (PMMA) films prepared by this technique have been explored as high-resolution electron beam resists. The lithographic exposure conditions of Langmuir{endash}Blodgett PMMA films were investigated and the results of fabricating a 4 in. mask with 0.38 {mu}m in feature linewidth and 0.5 {mu}m in resolution were achieved by using the Jeoptic ZBA-23 electron-beam machine as the exposure tool. {copyright} {ital 1997 American Vacuum Society.}
- OSTI ID:
- 450297
- Journal Information:
- Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena, Journal Name: Journal of Vacuum Science and Technology. B, Microelectronics Processing and Phenomena Journal Issue: 1 Vol. 15; ISSN JVTBD9; ISSN 0734-211X
- Country of Publication:
- United States
- Language:
- English
Similar Records
Turning electrospun poly(methyl methacrylate) nanofibers into graphitic nanostructures by in situ electron beam irradiation
Differential dissolution and electron-beam lithographic sensitivity of poly(methyl methacrylate). [Gamma radiation]
Poly(methyl methacrylate) degradation during x-ray photoelectron spectroscopy analysis
Journal Article
·
Thu Feb 14 23:00:00 EST 2008
· Journal of Applied Physics
·
OSTI ID:21133960
Differential dissolution and electron-beam lithographic sensitivity of poly(methyl methacrylate). [Gamma radiation]
Journal Article
·
Wed Jun 01 00:00:00 EDT 1977
· Polym. Eng. Sci.; (United States)
·
OSTI ID:6167541
Poly(methyl methacrylate) degradation during x-ray photoelectron spectroscopy analysis
Journal Article
·
Wed Feb 28 23:00:00 EST 1990
· Journal of Vacuum Science and Technology, A (Vacuum, Surfaces and Films); (USA)
·
OSTI ID:6910106