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Electron-bombardment-induced annealing stages in n-type germanium. 2

Journal Article · · Jap. J. Appl. Phys., v. 12, no. 7, pp. 957-961
OSTI ID:4349728
Annealing stages in n-type germanium bombarded with electrons have been investigated. In isothermal annealing curves it has often been found that the apparent number of defects that rccover at a given annealing stage is temperature- dependent. The physics of this phenomenon can not be understood simply. In order to give somc physical meaning to this phenomenon. an armealing model is proposed. In this model, one type of defect is assumed to be annihilated by two annihilation processes that occur nearly simultaneously. One of the processes can be observed by measuring electric resistivity, but the other is assumed to be unobservable. It is further assumed that these processes have different activation energies. (auth)
Research Organization:
Osaka Univ., Toyonaka, Japan
NSA Number:
NSA-29-021581
OSTI ID:
4349728
Journal Information:
Jap. J. Appl. Phys., v. 12, no. 7, pp. 957-961, Journal Name: Jap. J. Appl. Phys., v. 12, no. 7, pp. 957-961; ISSN JJAPA
Country of Publication:
Japan
Language:
English

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