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Positron lifetime in neutron-irradiated germanium

Journal Article · · Sov. Phys. - Semicond. (Engl. Transl.); (United States)
OSTI ID:5408413
A model is proposed for calculating the average positron lifetime (before annihilation) in the case when positrons are captured by traps of two types. The average positron lifetime calculated from the experimentally determined angular correlation of the annihilation ..gamma.. rays increases during stage I of isochronous annealing of neutron-irradiated germanium and decreases during stage II to the value before irradiation. The experimental and calculated dependences of the average positron lifetime on the annealing temperature are in qualitative agreement. The observed narrowing of the angular correlation curves and increase in the positron lifetime in neutron-irradiated germanium are inversely proportional to one another. A combined analysis of the annihilation, electrical, and x-ray experiments shows that during annealing of neutron-irradiated germanium the process of positron annihilation is influenced by two types of positron-sensitive defects, which are formed by irradiation (mainly disordered regions) and during stage I of the annealing process (probably divacancies).
Research Organization:
Institute of Electronics, Academy of Sciences of the Uzbek SSR, Tashkent
OSTI ID:
5408413
Journal Information:
Sov. Phys. - Semicond. (Engl. Transl.); (United States), Journal Name: Sov. Phys. - Semicond. (Engl. Transl.); (United States) Vol. 14:2; ISSN SPSEA
Country of Publication:
United States
Language:
English

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