Skip to main content
U.S. Department of Energy
Office of Scientific and Technical Information

Capture of positrons by radiation defects in germanium

Journal Article · · Sov. Phys. - Semicond. (Engl. Transl.); (United States)
OSTI ID:5230170
It was found that the positron annihilation method could be used to study the thermodynamic characteristics of disordered regions in germanium. The method of angular correlation of the annihilation ..gamma.. rays was used to study positron annihilation in germanium irradiated with fast reactor neutrons. The results indicated that positrons were captured by defects formed as a result of neutron irradiation. A study of the influence of isochronous annealing (involving measurement of the counting rate at the maximum of the angular correlation curve) revealed the existence of two stages of annealing of those defects which acted as the positron-capture centers. The first stage was described by a chemical kinetics equation of the first order with an activation energy of 0.18 eV and attributed tentatively to the ''evaporation'' of vacancies from disordered regions formed by fast neutrons; the second annealing stage obeyed a chemical kinetics equation of the second order with an activation energy of 1.8 eV.
Research Organization:
Institute of Electronics, Academy of Sciences of the Uzbek SSR, Tashkent
OSTI ID:
5230170
Journal Information:
Sov. Phys. - Semicond. (Engl. Transl.); (United States), Journal Name: Sov. Phys. - Semicond. (Engl. Transl.); (United States) Vol. 11:8; ISSN SPSEA
Country of Publication:
United States
Language:
English

Similar Records

Positron lifetime in neutron-irradiated germanium
Journal Article · Thu Jan 31 23:00:00 EST 1980 · Sov. Phys. - Semicond. (Engl. Transl.); (United States) · OSTI ID:5408413

Positron annihilation in neutron-irradiated germanium
Journal Article · Sat Mar 31 23:00:00 EST 1979 · Sov. Phys. - Solid State (Engl. Transl.); (United States) · OSTI ID:5880108

Study of radiation damage in metals by positron annihilation
Journal Article · Tue Feb 28 23:00:00 EST 1978 · J. Vac. Sci. Technol.; (United States) · OSTI ID:6941195