A 250-ps time-resolution CMOS multihit time-to-digital converter for nuclear physics experiments
Journal Article
·
· IEEE Transactions on Nuclear Science
- Univ. of Pisa (Italy)
This paper presents a CMOS realization of a time-to-digital converter (TDC) for nuclear physics experiments. An innovative and robust architecture, already used in a previous TDC version with 1 ns of bin size, has been adopted and improved with the aim to achieve a 500-ps bin size. The TDC has eight input channels plus a common channel. It can store up to 32 events per channel with a double-hit resolution of 8 ns. It can realize common-start and common-stop operations. It has 4.2 ms of input range with a 125-MHz system clock. The chip uses an asynchronous interpolator system based on a delay-locked line to increase the coarse resolution. It has been fabricated in a double-metal single poly n-well, 1-{micro}m CMOS process with an area of about 77 mm{sup 2}. Measurements show that the TDC has better performance compared to similar devices, especially the time resolution below 250 ps.
- OSTI ID:
- 343625
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 2 Vol. 46; ISSN 0018-9499; ISSN IETNAE
- Country of Publication:
- United States
- Language:
- English
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