MTD 132; A new sub-nanosecond multi-hit CMOS time-to-digital converter

Journal Article · Mon Apr 01 04:00:00 EST 1991 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.289279· OSTI ID:5112610

Kleinfelder, S; Majors, T J; Blumer, K A; Farr, W; Manor, B ^[1]

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1. LeCroy Corp., Chestnut Ridge, NY (US)

This paper describes a new 8 channel, 16 hit, sub-nanosecond resolution, 16 bit dynamic range time-to- digital VLSI CMOS circuit. It can operate in either common start or common stop mode and records either leading, trailing, or both input edges. Double pulse resolution is 15 ns. Readout is sparsified, and input signal levels are ECL while control and output levels are CMOS. Measured performance of prototype devices is presented. A CAMAC and a FASTBUS TDC board using this chip are under development.

• OSTI ID: 5112610
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 38:2; ISSN 0018-9499; ISSN IETNA
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
426000 -- Engineering-- Components
Electron Devices & Circuits-- (1990-)
440104* -- Radiation Instrumentation-- High Energy Physics Instrumentation
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
CAMAC SYSTEM
DIGITAL CIRCUITS
ELECTRONIC CIRCUITS
ELECTRONIC EQUIPMENT
EQUIPMENT
FASTBUS SYSTEM
MEASURING INSTRUMENTS
PERFORMANCE
PULSE CONVERTERS
RADIATION DETECTORS
RESOLUTION
TIME RESOLUTION
TIMING PROPERTIES