Total dose correlation of 4007 devices flown on the CRRES MEP experiment
Journal Article
·
· IEEE Transactions on Nuclear Science
- Maxwell Labs., San Diego, CA (United States)
- Phillips Lab., Hanscom AFB, MA (United States)
This paper considers total dose measurements of six 4007 type devices in the Microelectronics Package (MEP) on board the Combined Release and Radiation Effects Satellite (CRRES). The on-orbit device performance of the 4007 devices is compared to {sup 60}Co ground test data from identical devices. The results show that the low dose rate space data and the higher dose rate {sup 60}Co data agree within a factor of 2.5 for all six 4007 device types.
- OSTI ID:
- 32036
- Report Number(s):
- CONF-940726--
- Journal Information:
- IEEE Transactions on Nuclear Science, Journal Name: IEEE Transactions on Nuclear Science Journal Issue: 6Pt1 Vol. 41; ISSN IETNAE; ISSN 0018-9499
- Country of Publication:
- United States
- Language:
- English
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