CRRES microelectronics test package (MEP)

Journal Article · Wed Mar 31 23:00:00 EST 1993 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

DOI:https://doi.org/10.1109/23.212346· OSTI ID:6535561

Mullen, E G; Ray, K P ^[1]

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1. PL/GPSP, Hanscom AFB, MA (United States)

The Microelectronics Test Package (MEP) flown on board the Combined Release and Radiation Effects Satellite (CRRES) contained over 60 device types and approximately 400 total devices which were tested for both single event upset (SEU) and total dose (parametric degradation and annealing). A description of the experiment, the method of testing devices, and the structure of data acquisition are presented. Sample flight data are shown. These included SEUs from a GaAs 1 K RAM during the March 1991 solar flare, and a comparison between passive shielding and a specially designed spot shielding package.

• OSTI ID: 6535561
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 40:2; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
COMPARATIVE EVALUATIONS
DATA ACQUISITION
ELECTRONIC EQUIPMENT
EQUIPMENT
EVALUATION
FAILURES
FLIGHT TESTING
MEMORY DEVICES
MICROELECTRONICS
PHYSICAL RADIATION EFFECTS
RADIATION EFFECTS
SATELLITES
SHIELDING
SOLAR ACTIVITY
SOLAR FLARES
SPACE FLIGHT
TESTING