SEU flight data from the CRRES MEP
Conference
·
· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5707736
- Naval Research Lab., Washington, DC (United States)
This paper reports that analysis of single event upset data from the CRRES MEP from 27 July 1990 through 26 March 1991 has shown that upsets are being observed each orbit, the 93422 and 93L422 bipolar RAMs are the most sensitive devices, proton upsets in the radiation belts predominate over cosmic ray upsets, and many devices exhibit multiple bit upsets.
- OSTI ID:
- 5707736
- Report Number(s):
- CONF-910751--
- Conference Information:
- Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 38:6
- Country of Publication:
- United States
- Language:
- English
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Conference
·
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· IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
·
OSTI ID:7125363
Related Subjects
440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
661320 -- Auroral
Ionospheric
& Magnetospheric Phenomena-- (1992-)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BARYONS
COSMIC RADIATION
DATA ANALYSIS
ELEMENTARY PARTICLES
EQUIPMENT
FERMIONS
HADRONS
IONIZING RADIATIONS
NUCLEONS
PROTONS
RADIATION BELTS
RADIATION EFFECTS
RADIATIONS
SATELLITES
SEMICONDUCTOR DEVICES
SENSITIVITY
SPACE
TRANSISTORS
VARIATIONS
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
661320 -- Auroral
Ionospheric
& Magnetospheric Phenomena-- (1992-)
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BARYONS
COSMIC RADIATION
DATA ANALYSIS
ELEMENTARY PARTICLES
EQUIPMENT
FERMIONS
HADRONS
IONIZING RADIATIONS
NUCLEONS
PROTONS
RADIATION BELTS
RADIATION EFFECTS
RADIATIONS
SATELLITES
SEMICONDUCTOR DEVICES
SENSITIVITY
SPACE
TRANSISTORS
VARIATIONS