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SEU flight data from the CRRES MEP

Conference · · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)
OSTI ID:5707736
 [1]
  1. Naval Research Lab., Washington, DC (United States)
This paper reports that analysis of single event upset data from the CRRES MEP from 27 July 1990 through 26 March 1991 has shown that upsets are being observed each orbit, the 93422 and 93L422 bipolar RAMs are the most sensitive devices, proton upsets in the radiation belts predominate over cosmic ray upsets, and many devices exhibit multiple bit upsets.
OSTI ID:
5707736
Report Number(s):
CONF-910751--
Conference Information:
Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Journal Volume: 38:6
Country of Publication:
United States
Language:
English

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