Results from the CRRES MEP experiment. [Combined Release and Radiation Effects Satellite's Microelectronics Package Space Experiment]

Conference · Wed Jun 01 00:00:00 EDT 1994 · IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States)

OSTI ID:6598073

Campbell, A; Reeves, M ^[1]; McDonald, P ^[2]; Gonyea, R ^[3]

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1. Naval Research Lab., Washington, DC (United States)
2. SFA Inc., Landover, MD (United States)
3. Telenetics Inc., Landover, MD (United States)

The Combined Release and Radiation Effects Satellite (CRRES) was launched in July of 1990 and collected on-orbit data from a number of space experiments for almost 15 months. Included in the complement of experiments was a computer test system looking at radiation effects in integrated circuits call the Microelectronics Package Space Experiment (MEP). The effects of space radiation on microelectronics devices will be presented as measured by the Microelectronics Package Space Experiment on the Combined Release and Radiation Effects Satellite.

• OSTI ID: 6598073
• Report Number(s): CONF-930953--
• Journal Information: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States), Journal Name: IEEE Transactions on Nuclear Science (Institute of Electrical and Electronics Engineers); (United States) Vol. 41:3Pt1; ISSN 0018-9499; ISSN IETNAE
• Country of Publication: United States
• Language: English

Related Subjects

440200* -- Radiation Effects on Instrument Components
Instruments
or Electronic Systems
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
BARYONS
COSMIC RADIATION
ELECTRONIC CIRCUITS
ELEMENTARY PARTICLES
FERMIONS
HADRONS
INTEGRATED CIRCUITS
IONIZING RADIATIONS
MEASURING METHODS
MEMORY DEVICES
MICROELECTRONIC CIRCUITS
NUCLEONS
PHYSICAL RADIATION EFFECTS
PROTONS
RADIATION EFFECTS
RADIATIONS
TRAPPED PROTONS