Measurement of 50-fs (rms) electron pulses

Journal Article · Fri May 05 04:00:00 EDT 1995 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.48044· OSTI ID:249312

Lihn, H; Kung, P; Wiedemann, H ^[1]; Bocek, D ^[2]

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1. Applied Physics Department and SLAC, Stanford University, Stanford, California 94305 (United States)
2. Physics Department and SLAC, Stanford University, Stanford, California 94305 (United States)

Electron pulses generated at the Stanford SUNSHINE facility with (2--4.6){times}10{sup 8} electrons per microbunch have been measured as short as 50 fs (rms). The bunch length is determined by optical autocorrelation via a far-infrared Michelson interferometer using coherent transition radiation emitted at wavelengths longer than and equal to the bunch length. This frequency-resolved autocorrelation method demonstrates a better sub-picosecond resolving power than any existing time-resolved method. The experimental setup and the results will be described. {copyright} {ital 1995} {ital American} {ital Institute} {ital of} {ital Physics}.

• Research Organization: Stanford Linear Accelerator Center
• DOE Contract Number: AC03-76SF00515
• OSTI ID: 249312
• Report Number(s): CONF-9410219--
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 333; ISSN 0094-243X; ISSN APCPCS
• Country of Publication: United States
• Language: English

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