Generation and measurement of 50-fs(rms) electron pulses

Journal Article · Mon Aug 15 04:00:00 EDT 1994 · Physical Review Letters; (United States)

DOI:https://doi.org/10.1103/PhysRevLett.73.967· OSTI ID:6973176

Kung, P; Lihn, H; Wiedemann, H ^[1]; Bocek, D ^[2]

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1. Applied Physics Department and Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309 (United States)
2. Physics Department and Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309 (United States)

An electron source has been developed at the Stanford SUNSHINE facility which can produce electron bunches as short as 50 fs (rms) with (2[minus]4.6)[times]10[sup 8][ital e][sup [minus]] per microbunch. This source consists of a 2.6 MeV rf gun with a thermionic cathode and an alpha magnet for bunch compression. Coherent transition radiation emitted at wavelengths equal to the bunch length and longer is used in a Michelson interferometer to determine the bunch length by optical autocorrelation. The experimental setup and results of bunch length measurements are described.

• DOE Contract Number: AC03-76SF00515
• OSTI ID: 6973176
• Journal Information: Physical Review Letters; (United States), Journal Name: Physical Review Letters; (United States) Vol. 73:7; ISSN 0031-9007; ISSN PRLTAO
• Country of Publication: United States
• Language: English

Related Subjects

661220* -- Particle Beam Production & Handling
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BEAM BUNCHING
BEAM DYNAMICS
BEAMS
CATHODES
COHERENT RADIATION
DATA
EDUCATIONAL FACILITIES
ELECTRODES
ELECTROMAGNETIC RADIATION
ELECTRON BEAMS
ELECTRON GUNS
ELECTRON SOURCES
EMISSION
ENERGY RANGE
ENERGY SPECTRA
EXPERIMENTAL DATA
FABRICATION
INFORMATION
INTERFEROMETERS
LEPTON BEAMS
MAGNETS
MEASURING INSTRUMENTS
MEV RANGE
MEV RANGE 01-10
MICHELSON INTERFEROMETER
NUMERICAL DATA
PARTICLE BEAMS
PARTICLE SOURCES
PULSES
RADIATION SOURCES
RADIATIONS
RELATIVISTIC RANGE
SPECTRA
THERMIONIC EMISSION
Ta
Targets-- (1992-)