A Multifunctional Double Pulse Tester for Cascode GaN Devices

Yao, Tong; Ayyanar, Rajapandian

doi:10.1109/tie.2017.2694381

A Multifunctional Double Pulse Tester for Cascode GaN Devices

Journal Article · Fri Apr 14 00:00:00 EDT 2017 · IEEE Translations on Industrial Electronics

DOI:https://doi.org/10.1109/tie.2017.2694381· OSTI ID:2446700

Yao, Tong ^[1]; Ayyanar, Rajapandian ^[2]

Arizona State University, Tempe, AZ (United States); PowerAmerica/NC State University
Arizona State University, Tempe, AZ (United States)

Gallium Nitride (GaN) power devices with low switching and conduction losses can lead to superior power density in numerous power conversion applications. Their fast switching speeds, however, pose challenges in dynamic device characterization. The large parasitic inductances and contact impedances in conventional double pulse testers (DPTs) meant for Si devices, make them unsuitable for GaN characterization. GaN devices are directly soldered on to testers for minimizing parasitic effects. Furthermore, currently different testers are used for different types of device characterization, requiring the device under test (DUT) to be repeatedly soldered to different boards. This paper proposes a multi-functional tester well-suited for GaN devices and capable of completing all the dynamic characterization on the same board. The proposed tester is able to characterize: device turn on and off transition under hard and soft switching, dynamic Rdson, diode reverse recovery and device reverse conduction voltage drop. Here, the proposed tester has been implemented in hardware and the functions are validated with tests on a cascode GaN device. Some special properties of the cascode GaN device seen from these tests are highlighted. Detailed design procedures for selecting the critical components of the double pulse tester are presented.

View Accepted Manuscript (DOE)

Research Organization:: North Carolina State University, Raleigh, NC (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: EE0006521

OSTI ID:: 2446700

Alternate ID(s):: OSTI ID: 1541510

Journal Information:: IEEE Translations on Industrial Electronics, Journal Name: IEEE Translations on Industrial Electronics Journal Issue: 11 Vol. 64; ISSN 0278-0046

Publisher:: IEEECopyright Statement

Country of Publication:: United States

Language:: English

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Related Subjects

42 ENGINEERING
Gallium Nitride
WBG
cascode device
double pulse tester
dynamic Rdson
power device
reverse recovery

A Multifunctional Double Pulse Tester for Cascode GaN Devices

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