Applications of CdTe detectors in x-ray imaging and metrology

Conference · Fri Dec 31 04:00:00 EST 1993

OSTI ID:215631

Cuzin, M; Glasser, F; Lajzerowicz, J; Mathy, F; Verger, L ^[1]

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1. LETI, Grenoble (France)

Operating as a photoconductor, the sensitivity and the impulse response of semi-insulating materials greatly depend on the excitation duration compared to electron and hole lifetimes. The characteristic of ohmic contact for these compounds is shortly discussed. Before developing picosecond measurements with integrated autocorrelation system, this paper explains high energy industrial tomographic application with large CdTe detectors (25x15x0.9 mm{sup 3}) where spatial resolution, contrast and wide dynamic are the main criteria. The excitation is typically {micro}s range. X-ray flash radiography with 10 ns burst, is in an intermediate time domain where excitation is similar to electron life-time in cadmium telluride. In laser fusion experiment the excitation is in the range of 50 ps and the authors develop for such high band devices photoconductive structures able to study very short x-ray emission. Thin polycrystalline MOCVD CdTe films with picosecond response is an alternative material suitable to perform optical correlation measurements of single shot pulses with a very large bandwidth ({approximately}50 GHz).

• OSTI ID: 215631
• Report Number(s): CONF-930722--; ISBN 0-8194-1258-9
• Country of Publication: United States
• Language: English

Related Subjects

42 ENGINEERING
44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
CDTE SEMICONDUCTOR DETECTORS
CHEMICAL VAPOR DEPOSITION
COMPUTERIZED TOMOGRAPHY
NONDESTRUCTIVE TESTING
PHOTOCONDUCTORS
RESPONSE FUNCTIONS
USES
X-RAY DETECTION