Double hysteresis loop induced by defect dipoles in ferroelectric Pb(Zr{sub 0.8}Ti{sub 0.2})O{sub 3} thin films
Journal Article
·
· Journal of Applied Physics
- Department of Materials Science, Sichuan University, Chengdu 610064 (China)
Pb(Zr{sub 0.8}Ti{sub 0.2})O{sub 3} (PZT80/20) thin films were deposited on the Pt(111)/Ti/SiO{sub 2}/Si(100) substrates by RF magnetron sputtering. Mainly perovskite crystalline phase with highly (202)-preferred orientation, determined by x-ray diffraction, was formed in the lead zirconate titanate (PZT)(80/20) thin films. Polarization measurements of the unannealed and aged films showed a clear double hysteresis loop. However, the double hysteresis loop phenomenon was greatly suppressed in the PZT thin films annealed under pure oxygen, and thus they exhibited larger remnant polarization (P{sub r} = 6.3 {mu}C/cm{sup 2}). The related mechanism for the appearance of constricted and double hysteresis loops was investigated to be associated with the realignment and disassociation of defect dipoles via oxygen octahedral rotations or oxygen vacancy diffusion. The butterfly-shaped C-V characteristic curve with a valley gave further evidence for double hysteresis loop characteristic in the unannealed and aged PZT thin films.
- OSTI ID:
- 21538101
- Journal Information:
- Journal of Applied Physics, Journal Name: Journal of Applied Physics Journal Issue: 4 Vol. 109; ISSN JAPIAU; ISSN 0021-8979
- Country of Publication:
- United States
- Language:
- English
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· J. Appl. Phys.; (United States)
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Related Subjects
36 MATERIALS SCIENCE
ANNEALING
CHALCOGENIDES
COHERENT SCATTERING
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
CRYSTALS
DEPOSITION
DIELECTRIC MATERIALS
DIFFRACTION
DIFFUSION
DIPOLES
ELECTRON TUBES
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
EROSION
FERROELECTRIC MATERIALS
FILMS
GRAIN ORIENTATION
HEAT TREATMENTS
HYSTERESIS
LEAD COMPOUNDS
MAGNETRONS
MATERIALS
MICROSTRUCTURE
MICROWAVE EQUIPMENT
MICROWAVE TUBES
MINERALS
MULTIPOLES
NONMETALS
ORIENTATION
OXIDE MINERALS
OXIDES
OXYGEN
OXYGEN COMPOUNDS
PEROVSKITE
PEROVSKITES
POLARIZATION
PZT
SCATTERING
SILICON COMPOUNDS
SILICON OXIDES
SPUTTERING
SUBSTRATES
THIN FILMS
TITANATES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION
ZIRCONATES
ZIRCONIUM COMPOUNDS
ANNEALING
CHALCOGENIDES
COHERENT SCATTERING
CRYSTAL DEFECTS
CRYSTAL STRUCTURE
CRYSTALS
DEPOSITION
DIELECTRIC MATERIALS
DIFFRACTION
DIFFUSION
DIPOLES
ELECTRON TUBES
ELECTRONIC EQUIPMENT
ELEMENTS
EQUIPMENT
EROSION
FERROELECTRIC MATERIALS
FILMS
GRAIN ORIENTATION
HEAT TREATMENTS
HYSTERESIS
LEAD COMPOUNDS
MAGNETRONS
MATERIALS
MICROSTRUCTURE
MICROWAVE EQUIPMENT
MICROWAVE TUBES
MINERALS
MULTIPOLES
NONMETALS
ORIENTATION
OXIDE MINERALS
OXIDES
OXYGEN
OXYGEN COMPOUNDS
PEROVSKITE
PEROVSKITES
POLARIZATION
PZT
SCATTERING
SILICON COMPOUNDS
SILICON OXIDES
SPUTTERING
SUBSTRATES
THIN FILMS
TITANATES
TITANIUM COMPOUNDS
TRANSITION ELEMENT COMPOUNDS
X-RAY DIFFRACTION
ZIRCONATES
ZIRCONIUM COMPOUNDS