Polarized Infrared Reflectance Studies of Quaternary In{sub 0.04}Al{sub 0.06}Ga{sub 0.90}N

Journal Article · Wed Jul 07 04:00:00 EDT 2010 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.3469664· OSTI ID:21431091

Bakhori, S K. Mohd; Lee, S C; Ahmad, M A; Ng, S S; Hassan, H Abu ^[1]

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1. Nano-optoelectronics Research and Technology Laboratory School of Physics, Universiti Sains Malaysia, 11800, USM, Penang, (Malaysia)

Group III-nitride has re-gained considerable interest recently as wide direct band gap semiconductor materials for opto-electronic and high power devices. The quaternary InAlGaN have great flexibility in tailoring their band gap profile while maintaining their lattice-matching and structural integrity. In this study, we report for the first time the polarized infrared (IR) reflectance studies of quaternary In{sub 0.04}Al{sub 0.06}Ga{sub 0.90}N by using Fourier transform infrared spectroscopy of Perkin-Elmer. The quaternary In{sub 0.04}Al{sub 0.06}Ga{sub 0.90}N epilayers was grown on sapphire by molecular beam epitaxy. The polarized IR reflectance spectra obtained at incident angle of 15 deg. were then compared with modeling spectrum of damped harmonic oscillator. Through this study, the transverse and longitudinal optical phonon modes of quaternary In{sub 0.04}Al{sub 0.06}Ga{sub 0.90}N epilayers were obtained.

• OSTI ID: 21431091
• Journal Information: AIP Conference Proceedings, Journal Name: AIP Conference Proceedings Journal Issue: 1 Vol. 1250; ISSN APCPCS; ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
ABSORPTION SPECTROSCOPY
ALLOY SYSTEMS
ALLOYS
ALUMINIUM ALLOYS
CRYSTAL GROWTH METHODS
EPITAXY
FLEXIBILITY
FOURIER TRANSFORM SPECTROMETERS
GALLIUM ALLOYS
HARMONIC OSCILLATORS
INDIUM ALLOYS
INFRARED SPECTRA
MATERIALS
MEASURING INSTRUMENTS
MECHANICAL PROPERTIES
MOLECULAR BEAM EPITAXY
NITROGEN COMPOUNDS
PHONONS
QUASI PARTICLES
QUATERNARY ALLOY SYSTEMS
REFLECTION
SEMICONDUCTOR MATERIALS
SIMULATION
SPECTRA
SPECTROMETERS
SPECTROSCOPY
TENSILE PROPERTIES